PS-HM-8425 Hall Measurement Package for the CRX-VF Probe Station

PS-HM-8425 package features

• A complete solution for enabling Hall measurements in a CRX-VF probe station
• Supports a range of DC Hall measurements on wafer scale materials and structures as a function of temperature and field
• Includes all the instrumentation and software for facilitating Hall measurements
• Supports DC fields to 2 T and resistance from 0.5 mΩ to 100 GΩ
• Intuitive software provides easy system operation, data acquisition, and analysis
• Supports exporting of data for multi-carrier analysis

This solution adds several instruments to your CRX-VF console, including a switch matrix, current source, and voltmeter. However, the real power is provided in the 8400 Series HMS software.

This enables easy system operation, provides a suite of data acquisition and analysis tools, and allows you to control field, sample temperature, and sample excitation while running Hall measurements in an automated fashion.

With the software, you can:

• Perform van der Pauw and Hall bar measurements, and measure samples with gated Hall bars to account for gate bias—ideal for device-level material measurement
• Create a variable temperature Hall measurement with just three clicks of a mouse
• Start and end a measurement at your convenience, as well as set up time loops to repeat measurements according to a schedule
• Easily insert a resistance measurement into a Hall measurement sequence
• Perform resistance measurements at the start of an experiment—very useful when you need to do a quick, initial sample check to determine usable current, for instance

For more information, including specifications, charts, and other details, visit the product page on the Lake Shore website.