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Testforce CanadaM81-SSM Synchronous Source Measure System
M81-SSM features
Unique real-time sampling architecture for synchronous sourcing and measuring
- MeasureSync™ technology for simultaneous source module update and measure module sampling timing across all channels
- DC/AC amplitude and phase detection are user-selectable on all measure channels
- Common DAC/ADC sampling clock ensures highly precise and consistent source/measure timing coordination between 3 sources and 3 measures
Designed for scientific-grade low-level measurement applications
- Linear module power supply architecture for lowest possible source/measure noise
- Fully analog signal paths between data converters, modules, and the device under test (DUT)
- Remote modules for the shortest possible signal path to the DUT, which separates sensitive analog circuits from digital circuits and unwanted sources of interference typical of traditional single-enclosure instrument designs
The absolute precision of DC + the detection sensitivity performance of AC instrumentation
- All source and measure channels are capable of DC and AC to 100 kHz signals
- Optimized for fundamental, harmonic, and phase AC plus DC biased measurements
- Modularity allows for flexible, user-configured modules to suit a specific application
An innovative architecture for coordinating low-level measurements from DC to 100 kHz
The Lake Shore MeasureReady™ M81-SSM (Synchronous Source Measure) system provides a confident and straightforward approach for advanced measurement applications. The M81-SSM is designed to eliminate the complexity of multiple function-specific instrumentation setups, combining the convenience of DC and AC sourcing with DC and AC measurement, including a lock‑in’s sensitivity and measurement performance.
This extremely low-noise simultaneous source and measure system ensures inherently synchronized measurements from 1 to 3 source channels and from 1 to 3 measure channels per half-rack instrument — while also being highly adaptable for a range of material and device research applications.
Flexible measurement capabilities
The M81-SSM provides DC and AC stimulus and measurement capabilities for characterizing materials and devices in cryogenic, room temperature, and high-temperature environments.
Choose a combination of differential current source and voltage measurement modules for low-resistance applications requiring a precise stimulus current and the noise-cancellation benefits of balanced (floating) sample connections. Or mix and match with additional voltage source and current measurement modules for complex higher-impedance or gate-biasing applications where precise voltage control and sweeping test regimes are required.
Unlike a narrow-bandwidth DC system, these modules operate from very low frequencies to 100 kHz. You can select a measurement bandwidth to avoid 1/f noise and other bands where test environment noise is highest.
The system’s MeasureSync™ technology samples all sourcing and measurement channels at precisely the same time, enabling multiple DUTs to be tested under identical conditions so you can obtain consistent data.
Lake Shore MeasureLINK™ software can provide configurable measurement scripts and loops to support a variety of applications. It facilitates easy integration with Lake Shore cryogenic probe stations as well as third-party systems.
These combined capabilities make the M81‑SSM a superior solution for characterizing several test structures, including nanostructures, single- and multilayer atomic structures, MEMs, quantum structures, organic semiconductors, and superconducting materials.
For more information about the MeasureSync architecture and the instrument versions and modules available, as well as specifications, charts, and other details, visit the M81-SSM page on the Lake Shore website.
